LG 7/31/05
Mechanical Thinning Procedure for MIMOSA5 Detectors
We intend to test the effects of thinning on MIMOSA5 detectors. To accomplish this we will need to characterize the detectors before thinning, mechanically thin them, and then retest the thinned detectors. It is logistically difficult to accomplish this through probe testing with a probe card so we are using the existing hardware that we have for testing the detectors. We have tested this procedure with red coded MIMOSA5 chips and have successfully thinned and remounted the detectors. We will be testing 6 MIMOSA5 detectors, 2 thinned to 50 µm, 2 thinned to 35 µm and 2 thinned to 25 µm. Each set will consist of 1 red and 1 yellow coded chip. The existing testing system is shown schematically below.
The MIMOSA5 detector is glue bonded to the mezzanine card and electrically attached with wire bonds.
The basic procedure is outlined below.
We have tested the mechanical steps this process (except characterization) through with a red coded chip, and have been successful. Aptek is able to accommodate their grinding process to allow for the small residue of bond wire left on the silicon pads and deliver the chips ground to the correct thickness and with parallel sides.